Transmission electron microscopic study on rutile-type GeO2 film on TiO2 (001) substrate

Rutile-type GeO2 (r-GeO2) with an ultrawide bandgap of ∼4.7 eV has emerged as a promising material for next-generation power-electronic and optoelectronic devices. We performed transmission electron microscopy (TEM) observation to analyze the structural properties of r-GeO2 film on r-TiO2 (001) subs...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2024-11, Vol.125 (21)
Main Authors: Takane, Hitoshi, Konishi, Shinya, Ota, Ryo, Hayasaka, Yuichiro, Wakamatsu, Takeru, Isobe, Yuki, Kaneko, Kentaro, Tanaka, Katsuhisa
Format: Article
Language:English
Subjects:
Dislocation density
Electron energy loss spectroscopy
Germanium oxides
Optoelectronic devices
Photonic band gaps
Rutile
Threading dislocations
Titanium dioxide
Transmission electron microscopy
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Rutile-type GeO2 (r-GeO2) with an ultrawide bandgap of ∼4.7 eV has emerged as a promising material for next-generation power-electronic and optoelectronic devices. We performed transmission electron microscopy (TEM) observation to analyze the structural properties of r-GeO2 film on r-TiO2 (001) substrate at an atomic level. The r-GeO2 film exhibits a threading dislocation density of 3.6 × 109 cm−2 and there exist edge-, screw-, and mixed-type dislocations in the film as demonstrated by two-beam TEM. The edge-type dislocations have Burgers vectors of [100] and/or [110]. The bandgap of the r-GeO2 film is 4.74 ± 0.01 eV as determined by electron energy loss spectroscopy.
ISSN:0003-6951
1077-3118
DOI:10.1063/5.0236711