Depth resolution of a laser profilometer based on photo-EMF detector

A laser profilometer based on adaptive photo-EMF detector that can find application for testing optically rough surfaces is described. Depth resolution of the configuration is shown to depend on not only the coherence length of the wide-spectrum light source used, but also the interelectrode spacing...

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Bibliographic Details
Published in:Optik (Stuttgart) 2001, Vol.112 (4), p.175-176
Main Authors: Arroyo Carrasco, M.L., Rodriguez Montero, P., Sanchez Sanchez, M., Stepanov, S.
Format: Article
Language:English
Subjects:
Biological and medical applications
Coherence
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Metrological applications
Optical instruments, equipment and techniques
Optics
photo-EMF effect
Physics
topometry
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Summary:A laser profilometer based on adaptive photo-EMF detector that can find application for testing optically rough surfaces is described. Depth resolution of the configuration is shown to depend on not only the coherence length of the wide-spectrum light source used, but also the interelectrode spacing of the detector and crossing angle of interfering beams. Experimental demonstration of the device having an approximately 10 mm resolution and using a GaAs photo-EMF detector and a superluminescent diode was performed in tests of multisurface reflecting object.
ISSN:0030-4026
1618-1336
DOI:10.1078/0030-4026-00030