Analysis of Leakage Current Mechanisms in BiFeO 3 Thin Films

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Bibliographic Details
Published in:Ferroelectrics 2010-01, Vol.396 (1), p.60-66
Main Authors: Pipinys, P., Rimeika, A., Lapeika, V.
Format: Article
Language:English
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ISSN:0015-0193
1563-5112
DOI:10.1080/00150191003795270