Tunnelling currents through oxygen vacancies in ultrathin SiO 2 layer

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Bibliographic Details
Published in:International journal of electronics 2007-11, Vol.94 (11), p.985-994
Main Author: Mao, L. F.
Format: Article
Language:English
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ISSN:0020-7217
1362-3060
DOI:10.1080/00207210701755239