Ultra Trace Determination Scheme for 26 Al by High-Resolution Resonance Ionization Mass Spectrometry using a Pulsed Ti:Sapphire Laser

We propose an ultra trace analysis approach for 26 Al by high-resolution Resonance Ionization Mass Spectrometry (RIMS) using a pulsed narrow band-width Ti:Sapphire laser. For ensuring efficient ionization and high isotopic selectivity in RIMS of Al, we developed an injection seeded pulsed Ti:Sapphir...

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Bibliographic Details
Published in:Journal of nuclear science and technology 2008-09, Vol.45 (sup6), p.37-42
Main Authors: Tomita, Hideki, Mattolat, Christoph, Kessler, Thomas, Raeder, Sebastian, Schwellnus, Fabio, Wendt, Klaus D. A., Watanabe, Kenichi, Iguichi, Tetsuo
Format: Article
Language:English
Subjects:
Al-26
injection seeding
long-lived radioisotope
resonance ionization mass spectrometry
Ti:Sapphire laser
trace analysis
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Summary:We propose an ultra trace analysis approach for 26 Al by high-resolution Resonance Ionization Mass Spectrometry (RIMS) using a pulsed narrow band-width Ti:Sapphire laser. For ensuring efficient ionization and high isotopic selectivity in RIMS of Al, we developed an injection seeded pulsed Ti:Sapphire laser with high repetition rate operation at up to 10 kHz. The laser produced an output power of 2 W and a spectral band-width of ~20 MHz with a repetition rate of 7 kHz. A first demonstration of its performance was done by detecting stable 27 Al using RIMS.
ISSN:0022-3131
1881-1248
DOI:10.1080/00223131.2008.10875974