Investigation of the structural and electrical behaviour of Mn-substituted ZnO

Zinc oxide (ZnO) nanostructures with the general formula Zn 1-x Mn x O were made using a simple and affordable wet chemical coprecipitation method. X-ray diffraction (XRD), Fourier Transform Infrared (FTIR), and scanning electron microscopy (SEM) were used to examine the structure and morphology of...

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Bibliographic Details
Published in:Phase transitions 2024-03, Vol.97 (3), p.145-158
Main Authors: Kalyani, Ch, Subba Reddy, I. V., Raju, P., Missak Swarup Raju, P.
Format: Article
Language:English
Subjects:
Conductivity
coprecipitation
Crystal defects
dielectric constant
Dielectric loss
electrical conductivity
Fourier transforms
Grain boundaries
Nanostructures
Permittivity
Wurtzite
X-ray diffraction
Zinc oxide
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Summary:Zinc oxide (ZnO) nanostructures with the general formula Zn 1-x Mn x O were made using a simple and affordable wet chemical coprecipitation method. X-ray diffraction (XRD), Fourier Transform Infrared (FTIR), and scanning electron microscopy (SEM) were used to examine the structure and morphology of the produced samples. All of the prepared oxides were found to have a single crystalline phase that is ZnO-specific and has a wurtzite structure. It is found that DC conductivity rises with temperature and a steady drop in both AC and DC conductivity with Mn concentration is seen, which might be attributed to the creation of a grain boundary defect barrier. Complex impedance analysis is used to distinguish the grain and grain boundary contribution to the system. The parameters dielectric constant (k) and dielectric loss (tan δ) decreased as the frequency increased, and as the Mn concentration increased. With increasing temperatures, the dielectric constant and loss both increased.
ISSN:0141-1594
1029-0338
DOI:10.1080/01411594.2023.2300975