Bayes analysis of one-shot device testing data with correlated failure modes using copula models

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Bibliographic Details
Published in:Communications in statistics. Simulation and computation 2023-12, p.1-20
Main Authors: Ashkamini, Sharma, Reema, Upadhyay, Satyanshu K.
Format: Article
Language:English
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ISSN:0361-0918
1532-4141
DOI:10.1080/03610918.2023.2288802