Multi-band microwave sensor based on Hilbert's fractal for dielectric solid material characterization

A planar sensor designed using the fourth Hilbert fractal curve iteration for solid material characterization at multiple frequencies is reported in this paper. The fractal curve is self-similar with space-filling properties. The Hilbert fractal geometry is used to form a compact resonator, with a m...

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Bibliographic Details
Published in:Journal of electromagnetic waves and applications 2021-05, Vol.35 (7), p.848-860
Main Authors: Silva, C. P. do N., Araujo, J. A. I., Coutinho, M. S., de Oliveira, M. R. T., Llamas-Garro, I., de Melo, M. T.
Format: Article
Language:English
Subjects:
dielectric substrates
fractal geometry
Microwave sensor
multiband sensing
resonator
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Summary:A planar sensor designed using the fourth Hilbert fractal curve iteration for solid material characterization at multiple frequencies is reported in this paper. The fractal curve is self-similar with space-filling properties. The Hilbert fractal geometry is used to form a compact resonator, with a multiband frequency response where miniaturization is achieved since a large transmission line length is effectively confined in a limited area. The sensor provides five resonances in the frequency range from 0 to 5 GHz. The resonant frequencies are 0.56, 1.68, 2.72, 3.69 and 4.72 GHz, all used to measure the real permittivity of known samples with a sensitivity of 7, 20, 27, 43 and 50 MHz/permittivity, respectively. The sensor is used to measure dielectric samples with 20 × 20 mm 2 areas with several thicknesses. Simulations and measurements demonstrate that the Hilbert fractal geometry can be used to design a multiband planar sensor for solid dielectric material characterization.
ISSN:0920-5071
1569-3937
DOI:10.1080/09205071.2020.1861992