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Identification and Characterization of Arsenic and Metal Compounds in Contaminated Soil, Mine Tailings, and House Dust Using Synchrotron-Based Microanalysis

A comprehensive understanding of the risk associated with metal-rich soils and other materials includes identification of the solid phases hosting the metals. Synchrotron microanalysis provides a powerful diagnostic tool to characterize metal-bearing particles in mine tailings, soils, lake sediments...

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Bibliographic Details
Published in:Human and ecological risk assessment 2011-01, Vol.17 (6), p.1292-1309
Main Authors: Jamieson, Heather E, Walker, Stephen R, Andrade, Claudio F, Wrye, Lori A, Rasmussen, Pat E, Lanzirotti, Antonio, Parsons, Michael B
Format: Article
Language:English
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Summary:A comprehensive understanding of the risk associated with metal-rich soils and other materials includes identification of the solid phases hosting the metals. Synchrotron microanalysis provides a powerful diagnostic tool to characterize metal-bearing particles in mine tailings, soils, lake sediments, windblown dust, and household dust. A near simultaneous combination of X-ray fluorescence, diffraction, and absorption experiments using a microfocused beam can provide information on elemental concentrations, crystal structure, and oxidation state of individual particles. This approach can distinguish multiple metal-hosting minerals and industrial compounds in a single sample. Our objective is to provide examples of the application of this technique to a range of materials representing potential risk to human or ecosystem health. These examples include arsenic-contaminated materials and metal-rich household dust. We have identified grains of scorodite and other arsenate minerals in mine tailings and associated airborne dust, arsenic trioxide in organic soils near an ore roaster, metallurgical products dispersed to the environment, and various metal-rich particles in household dust. A comparison of chemical analysis of individual particles using electron microprobe analysis and synchrotron-based X-ray fluorescence analysis is provided.
ISSN:1549-7860
1080-7039
1549-7860
DOI:10.1080/10807039.2011.618415