XPS study of adsorption and desorption of a Bi thin film on the five-fold icosahedral Al-Pd-Mn surface

We have employed X-ray photoelectron spectroscopy to characterise the growth and thermal stability of a Bi thin film on the five-fold icosahedral Al-Pd-Mn surface. The growth can be characterised as Stranski-Krastanov, in agreement with previous STM studies. As a function of annealing temperature, t...

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Bibliographic Details
Published in:Philosophical magazine (2003. Print) 2011-07, Vol.91 (19-21), p.2889-2893
Main Authors: Young, K.M., Cross, N., Smerdon, J.A., Dhanak, V.R., Sharma, H.R., Lograsso, T.A., Ross, A.R., McGrath, R.
Format: Article
Language:English
Subjects:
adsorption
aluminium-palladium-manganese
Aluminum
Annealing
bismuth
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Icosahedral phase
Multilayers
Physics
quasicrystal
Quasicrystals
scanning tunnelling microscopy
Semi-periodic solids
Solid surfaces and solid-solid interfaces
Structure of solids and liquids
crystallography
surface
Surface chemistry
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin films
X-ray photoelectron spectroscopy
X-rays
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Summary:We have employed X-ray photoelectron spectroscopy to characterise the growth and thermal stability of a Bi thin film on the five-fold icosahedral Al-Pd-Mn surface. The growth can be characterised as Stranski-Krastanov, in agreement with previous STM studies. As a function of annealing temperature, the multilayer desorbs first and thereafter coverages of 1 ML and 0.5 ML are stable for significant temperature ranges.
ISSN:1478-6435
1478-6443
DOI:10.1080/14786435.2010.536793