Non-invasive dielectric measurements with the scanning potential microscope

The scanning potential microscope (SPM) is a new form of scanning microscope, which maps distributions of spatial potential by direct measurement. The SPM may be used to study the electrical properties of samples through the potential distribution created near the sample in response to an applied el...

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 1994-11, Vol.27 (11), p.2426-2430
Main Authors: Clippingdale, A J, Prance, R J, Clark, T D, Brouers, F
Format: Article
Language:English
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Summary:The scanning potential microscope (SPM) is a new form of scanning microscope, which maps distributions of spatial potential by direct measurement. The SPM may be used to study the electrical properties of samples through the potential distribution created near the sample in response to an applied electric field. Presents an SPM study of a test sample comprising three dielectric layers with differing relative permittivities: a 35 \#m\m film of cellulose acetate; a 25 \#m\m film of polyvinylidenefluoride; and a 50 \#m\m film of polytetrafluoroethylene. SPM mapping yielded values of relative permittivity that were within 2 per cent of the material specifications. (Original abstract-amended)
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/27/11/026