A method for evaluating the frequency characteristics of ac thin film electroluminescent devices

Although there are obvious variances in electrical and optical characteristics describing the frequency dependence in these devices, a method for the quantitative analysis of frequency characteristics is lacking. Presents a method for including the frequency dependence. It is assumed there is a phas...

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 1995-10, Vol.28 (10), p.2144-2149
Main Authors: Zong-Xin, Wang, Cardon, F
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
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Summary:Although there are obvious variances in electrical and optical characteristics describing the frequency dependence in these devices, a method for the quantitative analysis of frequency characteristics is lacking. Presents a method for including the frequency dependence. It is assumed there is a phase shift between the applied voltage and the equivalent current emitted from the phosphor-insulator interface. Combining the continuity equations and the tunnel current formula, the following have been obtained: the voltage in the phosphor layer; the phase shift between the applied voltage and the tunnel current; the average current; and the total amount of space charge in the phosphor layer at varying applied voltages and at different frequencies. (Original abstract-amended)
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/28/10/024