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Electronic properties of Co 2 MnSi thin films studied by hard x-ray photoelectron spectroscopy

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2009-04, Vol.42 (8), p.84011
Main Authors: Ouardi, Siham, Gloskovskii, Andrei, Balke, Benjamin, Jenkins, Catherine A, Barth, Joachim, Fecher, Gerhard H, Felser, Claudia, Gorgoi, Mihaela, Mertin, Marcel, Schäfers, Franz, Ikenaga, Eiji, Yang, Ke, Kobayashi, Keisuke, Kubota, Takahide, Oogane, Mikihiko, Ando, Yasuo
Format: Article
Language:English
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ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/42/8/084011