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Three-dimensional reciprocal space profile of an individual nanocrystallite inside a thin-film solar cell absorber layer

The strain profile of an individual Cu(In,Ga)Se2 nanocrystallite in a solar cell absorber layer is accessed using synchrotron radiation. We find that the investigated crystallite is inhomogeneously strained. The strain is most likely produced by a combination of intergranular strain and composition...

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2013-11, Vol.46 (47), p.475104-5
Main Authors: Slobodskyy, Taras, Schroth, Philip, Minkevich, Andrey, Grigoriev, Daniil, Fohtung, Edwin, Riotte, Markus, Baumbach, Tilo, Powalla, Michael, Lemmer, Uli, Slobodskyy, Anatoliy
Format: Article
Language:English
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Summary:The strain profile of an individual Cu(In,Ga)Se2 nanocrystallite in a solar cell absorber layer is accessed using synchrotron radiation. We find that the investigated crystallite is inhomogeneously strained. The strain is most likely produced by a combination of intergranular strain and composition variations in nanocrystals inside the polycrystalline semiconductor film and carries information about the intercrystalline interaction. The measurements are made nondestructively and without additional sample preparation or x-ray beam nanofocusing. This is the first step towards measurements of strain profiles of individual crystallites inside a working solar cell.
ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/46/47/475104