Hot-carrier degradation in submicrometre MOSFETs: from uniform injection towards the real operating conditions

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Bibliographic Details
Published in:Semiconductor science and technology 1995-09, Vol.10 (9), p.1208-1220
Main Authors: Groeseneken, G, Bellens, R, Bosch, G Van den, Maes, H E
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Testing, measurement, noise and reliability
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ISSN:0268-1242
1361-6641
DOI:10.1088/0268-1242/10/9/002