Quantitative approach in x-ray shadow microscopy

A novel implementation of x-ray shadow microscopy, ie, x-ray absorption microscopy (XAM), for analytical purposes has been developed. When using a microfocus x-ray source with an energy lower than 30 keV for XAM, the measured intensities are directly related to the spectral feature of the incident x...

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Bibliographic Details
Published in:Measurement science & technology 2000-11, Vol.11 (11), p.1602-1609
Main Authors: Wulveryck, J M, Odof, S, Mouze, D
Format: Article
Language:English
Subjects:
Computers in experimental physics
Exact sciences and technology
General equipment and techniques
Image processing
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Sensors (chemical, optical, electrical, movement, gas, etc.)
remote sensing
X- and γ-ray instruments and techniques
X-ray microscopes
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Summary:A novel implementation of x-ray shadow microscopy, ie, x-ray absorption microscopy (XAM), for analytical purposes has been developed. When using a microfocus x-ray source with an energy lower than 30 keV for XAM, the measured intensities are directly related to the spectral feature of the incident x-ray beam. Describes theoretically the problem of quantification without the use of an x-ray spectrometer, and presents an experimental application on standard specimens (binary and ternary samples). Shows that only the spectral distribution of the x-ray source used and the spectral response of the imaging sensor are needed to solve the question of quantification. The accuracy of the method and potential improvements are discussed. (Original abstract - amended)
ISSN:0957-0233
1361-6501
DOI:10.1088/0957-0233/11/11/309