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Spatially resolved high resolution interferometry

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Bibliographic Details
Published in:	Measurement science & technology 1991-04, Vol.2 (4), p.293-297
Main Authors:	Kroesen, G M W, Bisschops, T H J, Sanders, R H M, Jansen, A W, Schram, D C, Hoog, F J de
Format:	Article
Language:	English
Subjects:	Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Interferometers Optical instruments, equipment and techniques Physics
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
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