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A method for measuring thermal radiation properties of semi-transparent materials
Plastic films that are semi-transparent in the infrared are extensively used in solar energy applications and as mulches in agriculture. For analysing the performance of such systems, it is important to know their thermal radiation properties. Whereas transmissivity can be determined easily, measure...
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Published in: | Measurement science & technology 1994-09, Vol.5 (9), p.1061-1064 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Plastic films that are semi-transparent in the infrared are extensively used in solar energy applications and as mulches in agriculture. For analysing the performance of such systems, it is important to know their thermal radiation properties. Whereas transmissivity can be determined easily, measurement of emissivity poses a problem. The intensity usually consists of radiation emitted from the film and transmitted background radiation. A method for determining the hemispherical total emittance, reflectance and transmittance of plastic films simultaneously is presented. (Original abstract-amended) |
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ISSN: | 0957-0233 1361-6501 |
DOI: | 10.1088/0957-0233/5/9/005 |