Assessing the quality of scanning probe microscope designs

We present a method for assessing an atomic force microscope's (AFM's) ability to reject externally applied vibrations. This method is demonstrated on one commercial and two prototype AFMs. For optimally functioning AFMs, we find that the response to externally applied vibrations obeys a 1...

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Bibliographic Details
Published in:Nanotechnology 2001-09, Vol.12 (3), p.394-397
Main Authors: Thompson, James B, Drake, Barney, Kindt, Johannes H, Hoskins, Jessica, Hansma, Paul K
Format: Article
Language:English
Subjects:
Atomic force microscopes
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components and techniques
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Summary:We present a method for assessing an atomic force microscope's (AFM's) ability to reject externally applied vibrations. This method is demonstrated on one commercial and two prototype AFMs. For optimally functioning AFMs, we find that the response to externally applied vibrations obeys a 1/omega squared frequency dependence. This 1/omega squared frequency dependence can be understood by modeling the mechanical system which connects the AFM cantilever and the sample under test as a simple harmonic oscillator. According to such a model, the resonant frequency of the mechanical system that connects the AFM cantilever and the sample under test determines an AFM's ability to reject externally applied, low frequency vibrations. (Author)
ISSN:0957-4484
1361-6528
DOI:10.1088/0957-4484/12/3/331