Loading…

Nanoscale (EOT = 5.6 nm) nonvolatile memory characteristics using n-Si/SiO 2 / HfAlO nanocrystal/Al 2 O 3 / Ptcapacitors

Saved in:

Bibliographic Details
Published in:	Nanotechnology 2008-10, Vol.19 (43), p.435202
Main Authors:	Maikap, S, Rahaman, S Z, Tien, T C
Format:	Article
Language:	English
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!