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Ionization and recombination in nanosecond repetitively pulsed microplasmas in air at atmospheric pressure
We confine the nanosecond repetitively pulsed discharge to the micrometer scale, in a 200 µm discharge gap in air at atmospheric pressure and room temperature, focusing on measurements of the electron number density and electron temperature. The Stark broadening of H, O and N atomic lines and electr...
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Published in: | Journal of physics. D, Applied physics Applied physics, 2018-10, Vol.51 (49), p.494002 |
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container_title | Journal of physics. D, Applied physics |
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creator | Orrière, Thomas Moreau, Eric Pai, David Z |
description | We confine the nanosecond repetitively pulsed discharge to the micrometer scale, in a 200 µm discharge gap in air at atmospheric pressure and room temperature, focusing on measurements of the electron number density and electron temperature. The Stark broadening of H, O and N atomic lines and electrical conductivity both show that the electron number density reaches a maximum value of 1 × 1019 cm−3. Boltzmann plots show the electron temperature to be 72 kK several nanoseconds after the end of the pulse of applied electric field. We will use these results to determine the mechanism responsible for electron loss during the early recombination phase (t |
doi_str_mv | 10.1088/1361-6463/aae134 |
format | article |
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The Stark broadening of H, O and N atomic lines and electrical conductivity both show that the electron number density reaches a maximum value of 1 × 1019 cm−3. Boltzmann plots show the electron temperature to be 72 kK several nanoseconds after the end of the pulse of applied electric field. We will use these results to determine the mechanism responsible for electron loss during the early recombination phase (t < 500 ns) and comment on the degree of ionization and dissociation.</description><identifier>ISSN: 0022-3727</identifier><identifier>EISSN: 1361-6463</identifier><identifier>DOI: 10.1088/1361-6463/aae134</identifier><identifier>CODEN: JPAPBE</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>electron cooling ; ionization fraction ; microplasma ; Physics ; Plasma Physics ; pulsed breakdown ; spark ; three-body recombination</subject><ispartof>Journal of physics. 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D, Applied physics</title><addtitle>JPhysD</addtitle><addtitle>J. Phys. D: Appl. Phys</addtitle><description>We confine the nanosecond repetitively pulsed discharge to the micrometer scale, in a 200 µm discharge gap in air at atmospheric pressure and room temperature, focusing on measurements of the electron number density and electron temperature. The Stark broadening of H, O and N atomic lines and electrical conductivity both show that the electron number density reaches a maximum value of 1 × 1019 cm−3. Boltzmann plots show the electron temperature to be 72 kK several nanoseconds after the end of the pulse of applied electric field. We will use these results to determine the mechanism responsible for electron loss during the early recombination phase (t < 500 ns) and comment on the degree of ionization and dissociation.</description><subject>electron cooling</subject><subject>ionization fraction</subject><subject>microplasma</subject><subject>Physics</subject><subject>Plasma Physics</subject><subject>pulsed breakdown</subject><subject>spark</subject><subject>three-body recombination</subject><issn>0022-3727</issn><issn>1361-6463</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp9kUFLAzEQhYMoWKt3j3sSBNcmm2R3eyxFbaHgRc9hssnSlG4Skm2h_nqzrvQkwsDAm-8NzBuE7gl-JriuZ4SWJC9ZSWcAmlB2gSZn6RJNMC6KnFZFdY1uYtxhjHlZkwnarZ01X9AbZzOwKgu6cZ00dlSMzSxYF5P4M_O6N7056v0p84d91CrrTBOc30PsIA44mJBBn6pz0W91ME3mg47xEPQtumohme5--xR9vr58LFf55v1tvVxs8oZx2ue8IhIIVxxUU7Q1r2uslVSNKknNGlZJLJlqJeVUMwqEUc5lK5UibM7lHFM6RY_j3i3shQ-mg3ASDoxYLTZi0DAtqoJVxZEkFo9suiLGoNuzgWAx5CqGEMUQohhzTZan0WKcFzt3CDYd8x_-8AeuBCeCzVOx9BnhVUu_AZt3iE0</recordid><startdate>20181003</startdate><enddate>20181003</enddate><creator>Orrière, Thomas</creator><creator>Moreau, Eric</creator><creator>Pai, David Z</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0002-1748-1950</orcidid><orcidid>https://orcid.org/0000-0002-8492-5494</orcidid></search><sort><creationdate>20181003</creationdate><title>Ionization and recombination in nanosecond repetitively pulsed microplasmas in air at atmospheric pressure</title><author>Orrière, Thomas ; Moreau, Eric ; Pai, David Z</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c453t-571ba15d5adc2f85880edbdcd6184c47b0b4dfb353e43a14355bfbdd1495b9033</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>electron cooling</topic><topic>ionization fraction</topic><topic>microplasma</topic><topic>Physics</topic><topic>Plasma Physics</topic><topic>pulsed breakdown</topic><topic>spark</topic><topic>three-body recombination</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Orrière, Thomas</creatorcontrib><creatorcontrib>Moreau, Eric</creatorcontrib><creatorcontrib>Pai, David Z</creatorcontrib><collection>CrossRef</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Journal of physics. D, Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Orrière, Thomas</au><au>Moreau, Eric</au><au>Pai, David Z</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ionization and recombination in nanosecond repetitively pulsed microplasmas in air at atmospheric pressure</atitle><jtitle>Journal of physics. D, Applied physics</jtitle><stitle>JPhysD</stitle><addtitle>J. Phys. D: Appl. Phys</addtitle><date>2018-10-03</date><risdate>2018</risdate><volume>51</volume><issue>49</issue><spage>494002</spage><pages>494002-</pages><issn>0022-3727</issn><eissn>1361-6463</eissn><coden>JPAPBE</coden><abstract>We confine the nanosecond repetitively pulsed discharge to the micrometer scale, in a 200 µm discharge gap in air at atmospheric pressure and room temperature, focusing on measurements of the electron number density and electron temperature. The Stark broadening of H, O and N atomic lines and electrical conductivity both show that the electron number density reaches a maximum value of 1 × 1019 cm−3. Boltzmann plots show the electron temperature to be 72 kK several nanoseconds after the end of the pulse of applied electric field. We will use these results to determine the mechanism responsible for electron loss during the early recombination phase (t < 500 ns) and comment on the degree of ionization and dissociation.</abstract><pub>IOP Publishing</pub><doi>10.1088/1361-6463/aae134</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0002-1748-1950</orcidid><orcidid>https://orcid.org/0000-0002-8492-5494</orcidid><oa>free_for_read</oa></addata></record> |
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source | Institute of Physics |
subjects | electron cooling ionization fraction microplasma Physics Plasma Physics pulsed breakdown spark three-body recombination |
title | Ionization and recombination in nanosecond repetitively pulsed microplasmas in air at atmospheric pressure |
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