Loading…
The effect of temperature on charging behaviour of polyimide subjected to electron beam at vacuum
Saved in:
Published in: | Journal of physics. D, Applied physics Applied physics, 2021-10, Vol.54 (40), p.405301 |
---|---|
Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c311t-d0c478963e286cce87786cb5e8b70334f38cb7ec74020315725509f086a640a63 |
---|---|
cites | cdi_FETCH-LOGICAL-c311t-d0c478963e286cce87786cb5e8b70334f38cb7ec74020315725509f086a640a63 |
container_end_page | |
container_issue | 40 |
container_start_page | 405301 |
container_title | Journal of physics. D, Applied physics |
container_volume | 54 |
creator | Qin, Sichen Tu, Youping Xu, Duohu Chen, Bingying Tan, Tian Wang, Cong Yuan, Zhikang Chen, Geng |
description | |
doi_str_mv | 10.1088/1361-6463/ac12f8 |
format | article |
fullrecord | <record><control><sourceid>iop_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1088_1361_6463_ac12f8</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>dac12f8</sourcerecordid><originalsourceid>FETCH-LOGICAL-c311t-d0c478963e286cce87786cb5e8b70334f38cb7ec74020315725509f086a640a63</originalsourceid><addsrcrecordid>eNp1kM1rwzAMxc3YYF23-44-7bSscuzY7nGUfUFhl-5sHEduUpo6OEmh__0cOnbaQPCEeD8hPULuGTwx0HrBuGSZFJIvrGO51xdk9ju6JDOAPM-4ytU1uen7HQAUUrMZsZsaKXqPbqDB0wHbDqMdxog0HKirbdw2hy0tsbbHJoxxMnVhf2rapkLaj-UukVjRIVDcpzYmqkTbUjvQo3Xj2N6SK2_3Pd796Jx8vb5sVu_Z-vPtY_W8zhxnbMgqcELppeSYa-kcaqWSlgXqUgHnwnPtSoVOCciBs0LlRQFLD1paKcBKPidw3uti6PuI3nSxaW08GQZmishMeZgpD3OOKCEPZ6QJndml7w7pQFOZQhgBqQoOzHSVT8bHP4z_7v0GlBF0aw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>The effect of temperature on charging behaviour of polyimide subjected to electron beam at vacuum</title><source>Institute of Physics</source><creator>Qin, Sichen ; Tu, Youping ; Xu, Duohu ; Chen, Bingying ; Tan, Tian ; Wang, Cong ; Yuan, Zhikang ; Chen, Geng</creator><creatorcontrib>Qin, Sichen ; Tu, Youping ; Xu, Duohu ; Chen, Bingying ; Tan, Tian ; Wang, Cong ; Yuan, Zhikang ; Chen, Geng</creatorcontrib><identifier>ISSN: 0022-3727</identifier><identifier>EISSN: 1361-6463</identifier><identifier>DOI: 10.1088/1361-6463/ac12f8</identifier><identifier>CODEN: JPAPBE</identifier><language>eng</language><publisher>IOP Publishing</publisher><subject>charge accumulation ; electron radiation effects ; polyimide films ; temperature</subject><ispartof>Journal of physics. D, Applied physics, 2021-10, Vol.54 (40), p.405301</ispartof><rights>2021 IOP Publishing Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c311t-d0c478963e286cce87786cb5e8b70334f38cb7ec74020315725509f086a640a63</citedby><cites>FETCH-LOGICAL-c311t-d0c478963e286cce87786cb5e8b70334f38cb7ec74020315725509f086a640a63</cites><orcidid>0000-0003-1877-4402 ; 0000-0001-7507-2883 ; 0000-0003-1357-1294 ; 0000-0002-4630-534X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Qin, Sichen</creatorcontrib><creatorcontrib>Tu, Youping</creatorcontrib><creatorcontrib>Xu, Duohu</creatorcontrib><creatorcontrib>Chen, Bingying</creatorcontrib><creatorcontrib>Tan, Tian</creatorcontrib><creatorcontrib>Wang, Cong</creatorcontrib><creatorcontrib>Yuan, Zhikang</creatorcontrib><creatorcontrib>Chen, Geng</creatorcontrib><title>The effect of temperature on charging behaviour of polyimide subjected to electron beam at vacuum</title><title>Journal of physics. D, Applied physics</title><addtitle>JPhysD</addtitle><addtitle>J. Phys. D: Appl. Phys</addtitle><subject>charge accumulation</subject><subject>electron radiation effects</subject><subject>polyimide films</subject><subject>temperature</subject><issn>0022-3727</issn><issn>1361-6463</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNp1kM1rwzAMxc3YYF23-44-7bSscuzY7nGUfUFhl-5sHEduUpo6OEmh__0cOnbaQPCEeD8hPULuGTwx0HrBuGSZFJIvrGO51xdk9ju6JDOAPM-4ytU1uen7HQAUUrMZsZsaKXqPbqDB0wHbDqMdxog0HKirbdw2hy0tsbbHJoxxMnVhf2rapkLaj-UukVjRIVDcpzYmqkTbUjvQo3Xj2N6SK2_3Pd796Jx8vb5sVu_Z-vPtY_W8zhxnbMgqcELppeSYa-kcaqWSlgXqUgHnwnPtSoVOCciBs0LlRQFLD1paKcBKPidw3uti6PuI3nSxaW08GQZmishMeZgpD3OOKCEPZ6QJndml7w7pQFOZQhgBqQoOzHSVT8bHP4z_7v0GlBF0aw</recordid><startdate>20211007</startdate><enddate>20211007</enddate><creator>Qin, Sichen</creator><creator>Tu, Youping</creator><creator>Xu, Duohu</creator><creator>Chen, Bingying</creator><creator>Tan, Tian</creator><creator>Wang, Cong</creator><creator>Yuan, Zhikang</creator><creator>Chen, Geng</creator><general>IOP Publishing</general><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0003-1877-4402</orcidid><orcidid>https://orcid.org/0000-0001-7507-2883</orcidid><orcidid>https://orcid.org/0000-0003-1357-1294</orcidid><orcidid>https://orcid.org/0000-0002-4630-534X</orcidid></search><sort><creationdate>20211007</creationdate><title>The effect of temperature on charging behaviour of polyimide subjected to electron beam at vacuum</title><author>Qin, Sichen ; Tu, Youping ; Xu, Duohu ; Chen, Bingying ; Tan, Tian ; Wang, Cong ; Yuan, Zhikang ; Chen, Geng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c311t-d0c478963e286cce87786cb5e8b70334f38cb7ec74020315725509f086a640a63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>charge accumulation</topic><topic>electron radiation effects</topic><topic>polyimide films</topic><topic>temperature</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Qin, Sichen</creatorcontrib><creatorcontrib>Tu, Youping</creatorcontrib><creatorcontrib>Xu, Duohu</creatorcontrib><creatorcontrib>Chen, Bingying</creatorcontrib><creatorcontrib>Tan, Tian</creatorcontrib><creatorcontrib>Wang, Cong</creatorcontrib><creatorcontrib>Yuan, Zhikang</creatorcontrib><creatorcontrib>Chen, Geng</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of physics. D, Applied physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Qin, Sichen</au><au>Tu, Youping</au><au>Xu, Duohu</au><au>Chen, Bingying</au><au>Tan, Tian</au><au>Wang, Cong</au><au>Yuan, Zhikang</au><au>Chen, Geng</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The effect of temperature on charging behaviour of polyimide subjected to electron beam at vacuum</atitle><jtitle>Journal of physics. D, Applied physics</jtitle><stitle>JPhysD</stitle><addtitle>J. Phys. D: Appl. Phys</addtitle><date>2021-10-07</date><risdate>2021</risdate><volume>54</volume><issue>40</issue><spage>405301</spage><pages>405301-</pages><issn>0022-3727</issn><eissn>1361-6463</eissn><coden>JPAPBE</coden><pub>IOP Publishing</pub><doi>10.1088/1361-6463/ac12f8</doi><tpages>9</tpages><orcidid>https://orcid.org/0000-0003-1877-4402</orcidid><orcidid>https://orcid.org/0000-0001-7507-2883</orcidid><orcidid>https://orcid.org/0000-0003-1357-1294</orcidid><orcidid>https://orcid.org/0000-0002-4630-534X</orcidid></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0022-3727 |
ispartof | Journal of physics. D, Applied physics, 2021-10, Vol.54 (40), p.405301 |
issn | 0022-3727 1361-6463 |
language | eng |
recordid | cdi_crossref_primary_10_1088_1361_6463_ac12f8 |
source | Institute of Physics |
subjects | charge accumulation electron radiation effects polyimide films temperature |
title | The effect of temperature on charging behaviour of polyimide subjected to electron beam at vacuum |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T21%3A58%3A59IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-iop_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20effect%20of%20temperature%20on%20charging%20behaviour%20of%20polyimide%20subjected%20to%20electron%20beam%20at%20vacuum&rft.jtitle=Journal%20of%20physics.%20D,%20Applied%20physics&rft.au=Qin,%20Sichen&rft.date=2021-10-07&rft.volume=54&rft.issue=40&rft.spage=405301&rft.pages=405301-&rft.issn=0022-3727&rft.eissn=1361-6463&rft.coden=JPAPBE&rft_id=info:doi/10.1088/1361-6463/ac12f8&rft_dat=%3Ciop_cross%3Edac12f8%3C/iop_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c311t-d0c478963e286cce87786cb5e8b70334f38cb7ec74020315725509f086a640a63%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |