A novel methodology to measure the film thickness profile based on current stimulation for two-phase flow

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Bibliographic Details
Published in:Measurement science & technology 2021-12, Vol.32 (12), p.125110
Main Authors: de Moura, B F, da Mata, A M M, Martins, M F, Palma, F H S, Ramos, R
Format: Article
Language:English
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ISSN:0957-0233
1361-6501
DOI:10.1088/1361-6501/ac2437