Scanning high-sensitive x-ray polarization microscopy

We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10 −11 ) with a μ m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the...

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Bibliographic Details
Published in:New journal of physics 2022-05, Vol.24 (5), p.53051
Main Authors: Marx-Glowna, B, Grabiger, B, Lötzsch, R, Uschmann, I, Schmitt, A T, Schulze, K S, Last, A, Roth, T, Antipov, S, Schlenvoigt, H-P, Sergueev, I, Leupold, O, Röhlsberger, R, Paulus, G G
Format: Article
Language:English
Subjects:
Birefringence
channel-cut crystals
Crystal structure
Ion beams
Lenses
Microscopy
Physics
Polarization
Polarizers
Quantum electrodynamics
Quantum optics
x-ray lenses
x-ray optics
x-ray polarimetry
x-ray polarization microscopy
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Summary:We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10 −11 ) with a μ m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the polarizer and analyzer crystals as well as the composition and the form fidelity of the lenses, which must not exhibit any birefringence. The results show that these requirements are currently only met by polymer lenses. Highly sensitive scanning x-ray polarization microscopy thus is established as a new method. It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to x-ray spectroscopy, materials research, and laser physics.
ISSN:1367-2630
1367-2630
DOI:10.1088/1367-2630/ac6e80