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Scanning high-sensitive x-ray polarization microscopy
We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10 −11 ) with a μ m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the...
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| Published in: | New journal of physics 2022-05, Vol.24 (5), p.53051 |
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| Main Authors: | , , , , , , , , , , , , , |
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| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c448t-daaee1b6791844fa64e3c0f507c74143f29b17222330bb16c001591c1f8bb873 |
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| cites | cdi_FETCH-LOGICAL-c448t-daaee1b6791844fa64e3c0f507c74143f29b17222330bb16c001591c1f8bb873 |
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| container_issue | 5 |
| container_start_page | 53051 |
| container_title | New journal of physics |
| container_volume | 24 |
| creator | Marx-Glowna, B Grabiger, B Lötzsch, R Uschmann, I Schmitt, A T Schulze, K S Last, A Roth, T Antipov, S Schlenvoigt, H-P Sergueev, I Leupold, O Röhlsberger, R Paulus, G G |
| description | We report on the realization of an extremely sensitive x-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10
−11
) with a
μ
m-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the polarizer and analyzer crystals as well as the composition and the form fidelity of the lenses, which must not exhibit any birefringence. The results show that these requirements are currently only met by polymer lenses. Highly sensitive scanning x-ray polarization microscopy thus is established as a new method. It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to x-ray spectroscopy, materials research, and laser physics. |
| doi_str_mv | 10.1088/1367-2630/ac6e80 |
| format | article |
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−11
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μ
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It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to x-ray spectroscopy, materials research, and laser physics.</description><subject>Birefringence</subject><subject>channel-cut crystals</subject><subject>Crystal structure</subject><subject>Ion beams</subject><subject>Lenses</subject><subject>Microscopy</subject><subject>Physics</subject><subject>Polarization</subject><subject>Polarizers</subject><subject>Quantum electrodynamics</subject><subject>Quantum optics</subject><subject>x-ray lenses</subject><subject>x-ray optics</subject><subject>x-ray polarimetry</subject><subject>x-ray polarization microscopy</subject><issn>1367-2630</issn><issn>1367-2630</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><sourceid>DOA</sourceid><recordid>eNp9UD1PwzAUtBBIlMLOGImBhVA_f2dEFR-VKjHQ3XIcp3XVxsFJEeXXkxBUGBDTezrd3bt3CF0CvgWs1ASokCkRFE-MFU7hIzQ6QMe_9lN01jRrjAEUISPEX6ypKl8tk5VfrtLGVY1v_ZtL3tNo9kkdNib6D9P6UCVbb2NobKj35-ikNJvGXXzPMVo83C-mT-n8-XE2vZunljHVpoUxzkEuZAaKsdII5qjFJcfSSgaMliTLQRJCKMV5DsJ2sXgGFkqV50rSMZoNtkUwa11HvzVxr4Px-gsIcalNbL3dOF2oAmxObEYUZ0BYhgnmolCMF7kkpeq8rgavOobXnWtavQ67WHXpNRESJBZZl2iM8MDqP22iKw9XAeu-Z90Xqfsi9dBzJ7kZJD7UP57_0K__oFfrWhOmucacYg66Lkr6CW5JiXM</recordid><startdate>20220501</startdate><enddate>20220501</enddate><creator>Marx-Glowna, B</creator><creator>Grabiger, B</creator><creator>Lötzsch, R</creator><creator>Uschmann, I</creator><creator>Schmitt, A T</creator><creator>Schulze, K S</creator><creator>Last, A</creator><creator>Roth, T</creator><creator>Antipov, S</creator><creator>Schlenvoigt, H-P</creator><creator>Sergueev, I</creator><creator>Leupold, O</creator><creator>Röhlsberger, R</creator><creator>Paulus, G G</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>L7M</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>DOA</scope><orcidid>https://orcid.org/0000-0003-4400-1315</orcidid><orcidid>https://orcid.org/0000-0003-2951-4024</orcidid></search><sort><creationdate>20220501</creationdate><title>Scanning high-sensitive x-ray polarization microscopy</title><author>Marx-Glowna, B ; 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−11
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μ
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| ispartof | New journal of physics, 2022-05, Vol.24 (5), p.53051 |
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| subjects | Birefringence channel-cut crystals Crystal structure Ion beams Lenses Microscopy Physics Polarization Polarizers Quantum electrodynamics Quantum optics x-ray lenses x-ray optics x-ray polarimetry x-ray polarization microscopy |
| title | Scanning high-sensitive x-ray polarization microscopy |
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