Characterization of photonic crystal waveguides using Fabry–Perot resonances

A method for characterization of short photonic crystal waveguides is presented. The method utilizes mirror-enhanced Fabry-Perot resonances in the photonic crystal waveguide as well as in the insertion waveguides on either side of the photonic crystal waveguide. The method is applied to three-row de...

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Bibliographic Details
Published in:Journal of optics. A, Pure and applied optics Pure and applied optics, 2006-07, Vol.8 (7), p.S502-S506
Main Authors: Säynätjoki, A, Mulot, M, Arpiainen, S, Ahopelto, J, Lipsanen, H
Format: Article
Language:English
Subjects:
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Integrated optics. Optical fibers and wave guides
Optical and optoelectronic circuits
Optical materials
Optics
Photonic bandgap materials
Physics
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Summary:A method for characterization of short photonic crystal waveguides is presented. The method utilizes mirror-enhanced Fabry-Perot resonances in the photonic crystal waveguide as well as in the insertion waveguides on either side of the photonic crystal waveguide. The method is applied to three-row defect (W3) photonic crystal waveguides fabricated into silicon-on-insulator wafers. The results are compared with those obtained with the conventional Fabry-Perot method.
ISSN:1464-4258
1741-3567
DOI:10.1088/1464-4258/8/7/S30