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Determination of the transport properties in 4H-SiC wafers by Raman scattering measurement

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Bibliographic Details
Published in:	Chinese physics B 2011-03, Vol.20 (3), p.033301
Main Authors:	Sun, Guo-Sheng (国胜孙), Liu, Xing-Fang (兴防刘), Wu, Hai-Lei (海雷吴), Yan, Guo-Guo (果果闫), Dong, Lin (林董), Zheng, Liu (柳郑), Zhao, Wan-Shun (万顺赵), Wang, Lei (雷王), Zeng, Yi-Ping (一平曾), Li, Xi-Guang (锡光李), Wang, Zhan-Guo (占国王)
Format:	Article
Language:	English
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