Two-dimensional analytical model of double-gate tunnel FETs with interface trapped charges including effects of channel mobile charge carriers

• Published in: Journal of semiconductors 2017-02, Vol.38 (2), p.51-58
• Main Authors: Xu, Huifang, Dai, Yuehua
• Format: Article
• Language: English
• Subjects: 二维分析; 双栅; 场效应管; 模型; 电荷包; 界面陷阱; 载体效应; 隧道长度
• ISSN: 1674-4926
• DOI: 10.1088/1674-4926/38/2/024004

A two-dimensional analytical model of double-gate（DG） tunneling field-effect transistors（TFETs） with interface trapped charges is proposed in this paper. The influence of the channel mobile charges on the potential profile is also taken into account in order to improve the accuracy of the models. On the basis of potential profile,the electric field is derived and the expression for the drain current is obtained by integrating the BTBT generation rate. The model can be used to study the impact of interface trapped charges on the surface potential, the shortest tunneling length, the drain current and the threshold voltage for varying interface trapped charge densities, length of damaged region as well as the structural parameters of the DG TFET and can also be utilized to design the charge trapped memory devices based on TFET. The biggest advantage of this model is that it is more accurate,and in its expression there are no fitting parameters with small calculating amount. Very good agreements for both the potential, drain current and threshold voltage are observed between the model calculations and the simulated results.