The characterisation of nanostructured porous silicon/silver layers via Raman spectroscopy

The investigation of porous silicon/silver nanostructured composite layers (PS/Ag) via Raman spectroscopy technique has been carried out. Interpretation of PS/Ag Raman spectra has been proposed. Data from films acquired by varying anodization time showed a significant shift of a Raman peak primarily...

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Bibliographic Details
Published in:Journal of physics. Conference series 2018-06, Vol.1038 (1), p.12064
Main Authors: Smerdov, R S, Spivak, Yu M, Levitsky, V S, Moshnikov, V A
Format: Article
Language:English
Subjects:
Composite materials
Data acquisition
Low frequencies
Nanoparticles
Nanostructure
Physics
Porous silicon
Raman spectra
Raman spectroscopy
Silicon
Silver
Spectrum analysis
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Summary:The investigation of porous silicon/silver nanostructured composite layers (PS/Ag) via Raman spectroscopy technique has been carried out. Interpretation of PS/Ag Raman spectra has been proposed. Data from films acquired by varying anodization time showed a significant shift of a Raman peak primarily located at the frequency expected for monocrystalline silicon towards lower energy. In addition to the single peak a number of low-frequency bands emerged in the Raman spectra of silver-functionalised porous silicon. These effects have been interpreted as due to the influence of functionalizing silver nanoparticles and synthesis parameters on the structure and properties of composite material.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1038/1/012064