Estimation of permissible technological errors in the arrangement of optical elements for the hyperspectrometer according to the Offner's scheme

We propose mathematical tools and analyze the quality of an image in the detection plane of an Offner imaging hyperspectrometer, evaluating conditional arrangement tolerances for optical elements in the hyperspectrometer. The results of modeling a combined effect of the arrangement errors show that...

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Bibliographic Details
Published in:Journal of physics. Conference series 2018-09, Vol.1096 (1), p.12016
Main Authors: Rastorguev, A A, Kharitinov, S I, Kazanskiy, N L
Format: Article
Language:English
Subjects:
Image quality
Mathematical analysis
Microscopes
Optical components
Tolerances
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Summary:We propose mathematical tools and analyze the quality of an image in the detection plane of an Offner imaging hyperspectrometer, evaluating conditional arrangement tolerances for optical elements in the hyperspectrometer. The results of modeling a combined effect of the arrangement errors show that the probability for a hyperspectrometer to be assembled in compliance with requirements for image quality is not lower than 0.9.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1096/1/012016