Development of low cost EIT equipment for educational purposes

A simple and low-cost instrumentation system in this research for Electrical Impedance Tomography (EIT) experiments has been developed and committed to educational purposes. The developed EIT system mainly consist of two parts, e.g. chamber or phantom for placing measured sample and electronics devi...

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Bibliographic Details
Published in:Journal of physics. Conference series 2019-02, Vol.1153 (1), p.12041
Main Authors: Pitaloka, Bella, Zarkasi, Ahmad, R Santoso, Didik
Format: Article
Language:English
Subjects:
Alternating current
Conductors
Data simulation
Education
Electrical impedance
Equipment costs
Finite element method
Image reconstruction
Low cost
Measuring instruments
Multiplexing
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Summary:A simple and low-cost instrumentation system in this research for Electrical Impedance Tomography (EIT) experiments has been developed and committed to educational purposes. The developed EIT system mainly consist of two parts, e.g. chamber or phantom for placing measured sample and electronics device as measuring and controlling system. In the surface of phantom are placed as much as 16-electrodes circularly, the function is to inject current and measure spatial voltage across the object. AC current of 50 kHz is injected to the phantom boundary, then the surface potentials are measured using neighboring method. The developed data acquisition system has ability to record 16 channels simultaneously, thus does not require multiplexing technique which is can lead the delays that impact to the case of errors on the measurement results. For image reconstruction, an open source software, EIDORS, was used. Finite element modelling is a method used to simulate the reconstruction of the image process by imaging spheroidal phantoms in the circular of 16-electrodes array. As a comparison on the image reconstruction results, measurement data is presented in graphical using a Boundary Data Simulation (BDS). The experiment result shows the reconstructed images of a conductor and isolator, presenting the first step towards impedance imaging of other material sample.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1153/1/012041