Non-destructive testing of dielectric layers with defects

A microwave imaging method for non-destructive testing of dielectric surfaces beyond a layered media is presented. The method is based on the analytical continuation of the measured data to the surface under test through a special representation of the scattered field in terms of Fourier transform a...

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Bibliographic Details
Published in:Journal of physics. Conference series 2008-11, Vol.135 (1), p.012096
Main Authors: Tasdemir, C, Mudanyali, O, Yildiz, S, Semerci, O, Yapar, A
Format: Article
Language:English
Subjects:
Algorithms
Defects
Fourier transforms
Integral equations
Newton methods
Nondestructive testing
Physics
Regularization
Taylor series
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Summary:A microwave imaging method for non-destructive testing of dielectric surfaces beyond a layered media is presented. The method is based on the analytical continuation of the measured data to the surface under test through a special representation of the scattered field in terms of Fourier transform and Taylor expansion. Then the problem is reduced to the solution of a coupled system of non-linear integral equations which is solved iteratively via the Newton method with regularization in the least square sense. Numerical simulations show that defects having sizes in the order of λ/200 can be successfully recovered through the presented algorithm.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/135/1/012096