NanoXAS, a novel concept for high resolution microscopy

We currently develop a novel type of scanning x-ray microscope. This instrument will combine the chemical specificity of x-ray absorption spectroscopy with the very high spatial resolution of scanning probe microscopy . In a fundamentally new instrumental approach, the instrument can be used as a co...

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Bibliographic Details
Published in:Journal of physics. Conference series 2009-09, Vol.186 (1), p.012015
Main Authors: Schmid, I, Raabe, J, Quitmann, C, Vranjkovic, S, Hug, H J, Fink, R H
Format: Article
Language:English
Subjects:
Flux density
Fresnel zones
High resolution
Microscopes
Microscopy
Photoelectrons
Physics
Scanning probe microscopes
Scanning probe microscopy
Spatial resolution
Synchrotrons
X ray absorption
Zone plates
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Summary:We currently develop a novel type of scanning x-ray microscope. This instrument will combine the chemical specificity of x-ray absorption spectroscopy with the very high spatial resolution of scanning probe microscopy . In a fundamentally new instrumental approach, the instrument can be used as a conventional scanning transmission x-ray microscope (STXM), as a conventional scanning probe microscope (SPM) or in a mode combining these two techniques. In the latter case, the sample is placed in the focus generated by the fresnel zone plate of the STXM. The SPM-tip placed downstream acts as as a local detector of the emitted photoelectrons. Simulations and experiments have shown that the use of shielded SPM-tips is crucial to obtain a strongly increased chemical resolution. In contrast to similar projects underway at other synchrotrons we use a coaxial geometry. This should greatly enhance the flux density and reduce background signals caused by straylight illuminating the tip.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/186/1/012015