Modeling of polygonal half–loops dislocations in silicon single crystal using X–ray diffraction topo–tomography data

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Bibliographic Details
Published in:Journal of physics. Conference series 2021-09, Vol.2036 (1), p.12015
Main Authors: Grigorev, V A, Konarev, P V, Zolotov, D A, Buzmakov, A V
Format: Article
Language:English
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ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/2036/1/012015