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Parameterization of charge transport process with avalanche multiplication in irradiated Si p-i-n structures at T = 1.9 K

The study is devoted to the treatment of in situ radiation tests results for silicon p-i-n detectors of relativistic protons, which showed the two-stage process of charge transport with avalanche multiplication at a temperature of 1.9 K. The goal of the work is to extract the carrier transport param...

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Bibliographic Details
Published in:Journal of physics. Conference series 2021-11, Vol.2103 (1), p.12063
Main Authors: Shepelev, A S, Eremin, V K, Verbitskaya, E M
Format: Article
Language:English
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Summary:The study is devoted to the treatment of in situ radiation tests results for silicon p-i-n detectors of relativistic protons, which showed the two-stage process of charge transport with avalanche multiplication at a temperature of 1.9 K. The goal of the work is to extract the carrier transport parameters from the experimental data obtained by transient current technique. For that, the impact of a spatial nonuniformity of carrier generation by the laser and spreading of the drifting carrier cloud due to diffusion on the current pulse response formation were considered. The mathematical procedure proposed for the current pulse simulation showed a key contribution of avalanche multiplication in the signal formation and allowed direct estimation of the multiplication factor from the experimental pulses. It is found that this factor only slightly depends on the bias voltage, which suggests the electric field inside the detector to be affected by the space-charge-limited current.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/2103/1/012063