Numerical analysis and optimization of radio-frequency ion trap potential

The trap of multi-ion frequency standard is an ideal candidate for a new generation of ground and space-borne timekeeping systems, which has high signal-to-noise ratio, low frequency drift rate and excellent long-term frequency stability. The non-ideal characteristic of radio-frequency potential is...

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Bibliographic Details
Published in:Journal of physics. Conference series 2022-07, Vol.2313 (1), p.12024
Main Authors: Liu, Yuhan, Du, Lijun, He, Yuling, Huang, Shiyi, Zhang, Qiang, He, Keliang, Tang, Yulong, Meng, Yansong, Zhai, Shenghua
Format: Article
Language:English
Subjects:
Decoupling
Drift rate
Electric potential
Finite element method
Frequency drift
Frequency stability
Frequency standards
Ion traps (instrumentation)
Mathematical models
Numerical analysis
Numerical models
Optimization
Physics
Potential fields
Radio frequency
Signal to noise ratio
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Summary:The trap of multi-ion frequency standard is an ideal candidate for a new generation of ground and space-borne timekeeping systems, which has high signal-to-noise ratio, low frequency drift rate and excellent long-term frequency stability. The non-ideal characteristic of radio-frequency potential is one of the dominant factors that restrict the performance of ion frequency standard. In this study, the finite element numerical analysis method is used to quantitatively analyse and optimize the electrical potential field of ion trap, and an analytical model of ideal trapping potential is established. The typical transient numerical potential surface of trapping potential is used for decoupling analysis of various electrical potential effects. Based on the optimal structure parameters, the numerical model and analytical model of non-standard ion trap are established to verify the validity and accuracy of the numerical analysis method. This method can provide a quantitative solution for the high precision reconstruction of the trapping potential model of heterotype ion traps.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/2313/1/012024