Study of Inverse Ni-based Photonic Crystal using the Microradian X-ray Diffraction

Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant...

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Bibliographic Details
Published in:Journal of physics. Conference series 2010-10, Vol.247 (1), p.012029
Main Authors: Vasilieva, A V, Grigoryeva, N A, Mistonov, A A, Sapoletova, N A, Napolskii, K S, Eliseev, A A, Lukashin, A V, Tretyakov, Yu D, Petukhov, A V, Byelov, D, Chernyshov, D, Okorokov, A I, Bouwman, W G, Grigoriev, S V
Format: Article
Language:English
Subjects:
Crystals
Face centered cubic lattice
Lattice parameters
Nickel
Photonic crystals
Physics
Thickness
X-ray diffraction
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Summary:Inverse photonic nickel-based crystal films formed by electrocrystallization of metal inside the voids of polymer artificial opal have been studied using the microradian X-ray diffraction. Analysis of the diffraction images agrees with an face-centred cubic (FCC) structure with the lattice constant a0 650 ± 10 nm and indicates two types of stacking sequences coexisting in the crystal (twins of ABCABC... and ACBACB... ordering motifs), the ratio between them being 4:5 The transverse structural correlation length Ltran is 2.4 ± 0.1 μm, which corresponds to a sample thickness of 6 layers. The in-plane structural correlation length Llong is 3.4 ± 0.2 μm, and the structure mosaic is of order of 10°.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/247/1/012029