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The effect of subgrain mobility on recrystallization kinetics: phase-field simulation study

The influence of grain boundary mobility on the recrystallization process (ReX) was investigated in this study using the phase-field approach. In accordance with the Read-Shockley equation, for the interfacial mobility as a function of the misorientation angle, the resulting microstructural evolutio...

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Bibliographic Details
Published in:Journal of physics. Conference series 2023-11, Vol.2635 (1), p.12032
Main Authors: Abramova, O, Prahs, A, Schneider, D, Nestler, B
Format: Article
Language:English
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Summary:The influence of grain boundary mobility on the recrystallization process (ReX) was investigated in this study using the phase-field approach. In accordance with the Read-Shockley equation, for the interfacial mobility as a function of the misorientation angle, the resulting microstructural evolution was studied. It was observed that the disappearance of low-angle grain boundaries (LAGBs) during the ReX process caused high-angle grain boundaries to move faster during the subsequent ReX stages. For materials with high stacking energy, such as aluminum, LAGBs were additionally found to play a significant role in the ReX process. The kinetics of the ReX process, coupled with grain growth, showed the typical behavior observed in fine-grained structures of pure aluminum.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/2635/1/012032