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The effect of subgrain mobility on recrystallization kinetics: phase-field simulation study
The influence of grain boundary mobility on the recrystallization process (ReX) was investigated in this study using the phase-field approach. In accordance with the Read-Shockley equation, for the interfacial mobility as a function of the misorientation angle, the resulting microstructural evolutio...
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Published in: | Journal of physics. Conference series 2023-11, Vol.2635 (1), p.12032 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | The influence of grain boundary mobility on the recrystallization process (ReX) was investigated in this study using the phase-field approach. In accordance with the Read-Shockley equation, for the interfacial mobility as a function of the misorientation angle, the resulting microstructural evolution was studied. It was observed that the disappearance of low-angle grain boundaries (LAGBs) during the ReX process caused high-angle grain boundaries to move faster during the subsequent ReX stages. For materials with high stacking energy, such as aluminum, LAGBs were additionally found to play a significant role in the ReX process. The kinetics of the ReX process, coupled with grain growth, showed the typical behavior observed in fine-grained structures of pure aluminum. |
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ISSN: | 1742-6588 1742-6596 |
DOI: | 10.1088/1742-6596/2635/1/012032 |