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Characterization of U-based thin films: the UFe 2+ x case

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Bibliographic Details
Published in:	Journal of physics. Conference series 2011-07, Vol.303, p.12012
Main Authors:	Kim-Ngan, Nhu-T H, Havela, L, Adamska, A M, Daniš, S, Pešička, J, Macl, J, Eloirdi, R, Huber, F, Gouder, T, Balogh, A G
Format:	Article
Language:	English
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Online Access:	Get full text
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