Study of optical and structural properties of CZTS thin films grown by co-evaporation and spray pyrolysis

Results regarding optical and structural properties of Cu2ZnSnS4 (CZTS) thin films prepared by co-evaporation using a novel procedure are compared with those obtained with CZTS films grown using a solution based route. The lattice strain and crystallite size D of CZTS films prepared by co-evaporatio...

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Bibliographic Details
Published in:Journal of physics. Conference series 2016-02, Vol.687 (1), p.12041
Main Authors: Moreno, R, Ramirez, E A, Gordillo Guzmán, G
Format: Article
Language:English
Subjects:
Atomic force microscopy
Crystal defects
Crystallites
Evaporation
Lattice strain
Optical properties
Physics
Spray pyrolysis
Thin films
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Summary:Results regarding optical and structural properties of Cu2ZnSnS4 (CZTS) thin films prepared by co-evaporation using a novel procedure are compared with those obtained with CZTS films grown using a solution based route. The lattice strain and crystallite size D of CZTS films prepared by co-evaporation and by spray pyrolysis were estimated through X-ray diffraction (XRD) measurements using Williamson-Hall-isotropic strain model. The results of estimated average crystallite size of CZTS films by Scherrer and Williamson-Hall plot methods were compared with AFM (atomic force microscopy) measurements. It was found that the average crystallite size measured by Williamson-Hall plot methods agree quite well with AFM results. Further, information regarding the influence of preparation method on both, crystalline phases and the formation of structural defects was achieved through Raman and Urbach energy measurements.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/687/1/012041