Characterization of vacuum flash evaporated CdTe thin films for solar cell application

This paper reports the results of CdTe thin films characteristics deposited by vacuum flash evaporation technique. The characteristics of CdTe films deposited at different substrate and evaporator temperatures were analysed using different methods. XRD results have shown that all samples exhibit a p...

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Bibliographic Details
Published in:Journal of physics. Conference series 2018-01, Vol.945 (1), p.12013
Main Authors: Papikyan, A K, Gevorgyan, V A, Mangasaryan, N R, Gladyshev, P P
Format: Article
Language:English
Subjects:
Cadmium tellurides
Energy gap
Evaporation
Evaporators
Grain size
Photovoltaic cells
Physics
Solar cells
Substrates
Thin films
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Summary:This paper reports the results of CdTe thin films characteristics deposited by vacuum flash evaporation technique. The characteristics of CdTe films deposited at different substrate and evaporator temperatures were analysed using different methods. XRD results have shown that all samples exhibit a predominant sharp peak at 2θ around 23.80 which is assigned to the (111) plane of zinc blend cubic structure. AFM images of CdTe thin films have shown that grain size increases with increasing the substrate temperature, which correlates with XRD results. We have found that the decrease the evaporation temperature from 850°C to 650°C leads to the drastically increasing of the average grains sizes from 60 nm to 600 nm. The transmission and reflection spectrum of CdTe thin films are used to evaluate the bandgap Eg. All films have Eg (1.49 eV - 1.50 eV) correspond to the bandgap of a bulk CdTe crystal.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/945/1/012013