BETSEE: testing for system-wide effects of single event effects on ITk strip modules

The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Er...

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Bibliographic Details
Published in:Journal of instrumentation 2023-01, Vol.18 (1), p.C01019
Main Authors: Belanger-Champagne, C., Dandoy, J., Gallop, B.J., Gosart, T.C., Helling, C.M., Keener, P., Krizka, K., McGovern, B., Mullier, G., Poley, A.-L., Roberts, B.R., Sawyer, C., Wall, A., Wang, H., Warren, M.
Format: Article
Language:English
Subjects:
Accelerator Physics and Instrumentation
Acceleratorfysik och instrumentering
Digital electronic circuits
Front-end electronics for detector readout
Fysik
Heavy ions
Large Hadron Collider
Modules
Natural Sciences
Naturvetenskap
Physical Sciences
Radiation-hard detectors
Single Event Effects
Strip
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Summary:The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/18/01/C01019