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CdTe/CZT under high flux irradiation

Direct converting quantum counting detectors based on cadmium telluride and cadmium zinc telluride have been investigated with respect to their properties under intense X-ray irradiation. To derive a detailed picture of the performance of such detectors, the influence of the electric field, the dete...

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Bibliographic Details
Published in:Journal of instrumentation 2011-01, Vol.6 (1), p.C01055-C01055
Main Authors: Strassburg, Matthias, Schroeter, Christian, Hackenschmied, Peter
Format: Article
Language:English
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Summary:Direct converting quantum counting detectors based on cadmium telluride and cadmium zinc telluride have been investigated with respect to their properties under intense X-ray irradiation. To derive a detailed picture of the performance of such detectors, the influence of the electric field, the detector thickness, the temperature and the intensity of the X-ray irradiation was studied. The results are discussed in terms of the "polarization" phenomenon, a reduction of the electric field strength inside the detector due to immobile charge carriers accumulating during irradiation. Furthermore, the impact of Te-inclusions and -precipitates is presented.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/6/01/C01055