Micro crack imaging of silicon solar cells with SEM (Scanning Electron Microscopy)

Both monocrystalline and polycrystalline silicon based solar cells are proven to be widely used in the photovoltaic industry compared to other solar cell material such as titanium oxide or germanium due to abundant materials and economical production processes, however the problem occurs due to inte...

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Bibliographic Details
Published in:IOP conference series. Earth and environmental science 2021-10, Vol.878 (1), p.12062
Main Authors: Gunawan, W, Stepanus, S, Lisapaly, L, Mustari, F, Sutomo, H S
Format: Article
Language:English
Subjects:
Cracks
Damage
Defects
Germanium
Manufacturing industry
Photovoltaic cells
Photovoltaics
Polysilicon
Scanning electron microscopy
Silicon
Silicon wafers
Solar cells
Titanium oxide
Titanium oxides
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Summary:Both monocrystalline and polycrystalline silicon based solar cells are proven to be widely used in the photovoltaic industry compared to other solar cell material such as titanium oxide or germanium due to abundant materials and economical production processes, however the problem occurs due to internal (crack) defects in the silicon wafers. The cracks of silicon solar cells occur due to the manufacturing process or when applying them to the field in a relatively short time. Research was also carried out to determine the cause of the cracks and how much damage had occurred that affected the performance of silicon solar cells. By using SEM (Scanning Electron Microscopy) we will prove that, is it clear that the damage caused by production failure of external influences causes defects (micro cracks), holes, burns and so on. The advanced technology owned by SEM is expected to be reliable to find the location of the damage quickly and precisely because the result displayed are very accurate so that it is expected to be an evaluation for the solar cell production process in the future.
ISSN:1755-1307
1755-1315
DOI:10.1088/1755-1315/878/1/012062