Influence of Zinc Doping on the Structural, Morphological, Optical and Electrical Properties of Copper Oxide Thin Films Prepared by Jet-Nebulizer Spray Pyrolysis Technique

This research details the deposition and characterization of adding zinc (Zn) impurities with different doping concentrations (1%, 3%, and 5%) into copper oxide (CuO:Zn) by using a jet nebulizer spray pyrolysis system. The impact of zinc doping on the different copper oxide properties was investigat...

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Bibliographic Details
Published in:IOP conference series. Materials Science and Engineering 2021-07, Vol.1166 (1), p.12047
Main Authors: Jagadeesan, V, Rani Sangeetha, A, Anitha, P
Format: Article
Language:English
Subjects:
Chemical composition
Copper
Copper oxides
Direct current
Doping
Electrical properties
Emission analysis
Energy bands
Energy gap
Field emission microscopy
High resistance
Low currents
Magnetism
Occupancy
Optical properties
Spectrum analysis
Spray pyrolysis
Surface structure
Thin films
Zinc
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Summary:This research details the deposition and characterization of adding zinc (Zn) impurities with different doping concentrations (1%, 3%, and 5%) into copper oxide (CuO:Zn) by using a jet nebulizer spray pyrolysis system. The impact of zinc doping on the different copper oxide properties was investigated. The structural studies confirm that pure copper oxide and zinc doped copper oxide thin films are matched with monoclinic structure. High resolution schottky field emission scanning electron microscopy and Energy dispersive spectrum analysis identifies the surface structure and chemical composition of pure CuO and CuO: Zn thin films. EDS spectra reveal the occupancy of Cu, O, and Zn elements in the pure CuO and CuO:Zn thin films. The highest transmittance was observed as 66.91% for 5% Zn concentration. The absorption studies clearly indicated that the absorbance of the films was decreased when Zn doping concentration increase. The energy band gap value (Eg) is calculated as 2.01eV for pure CuO and the value of Eg for CuO:Zn thin films are varied from 2.07 to 2.26 eV. Keithley high resistance and low current electrometer was used to measure direct current conductivity of both pure CuO and CuO: Zn thin films and maximum conductivity value was observed for CuO: Zn (5%) thin film.
ISSN:1757-8981
1757-899X
DOI:10.1088/1757-899X/1166/1/012047