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Effect of texturization on a-Si:H/c-Si hetero-junctions investigated by PCD and μ W-PCD mapping of minority carrier’s lifetime
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Published in: | Surface topography metrology and properties 2019-12, Vol.7 (4), p.45003 |
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Main Authors: | , , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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ISSN: | 2051-672X 2051-672X |
DOI: | 10.1088/2051-672X/ab3efa |