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Analysis on the structural, vibrational and defect states of chlorine treated polycrystalline cadmium telluride structures grown by e-beam evaporation

Temperature dependent photoluminescence (PL) measurements are performed in order to study the defect states in cadmium chloride treated polycrystalline cadmium telluride (CdTe) thin films grown by e-beam evaporation technique. Three luminescence bands are observed including a double peak emission at...

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Bibliographic Details
Published in:Materials research express 2015-02, Vol.2 (2), p.25007-6
Main Authors: Farid, Sidra, Mukherjee, Souvik, Jung, Hyeson, Stroscio, Michael A, Dutta, Mitra
Format: Article
Language:English
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Summary:Temperature dependent photoluminescence (PL) measurements are performed in order to study the defect states in cadmium chloride treated polycrystalline cadmium telluride (CdTe) thin films grown by e-beam evaporation technique. Three luminescence bands are observed including a double peak emission at 1.577 eV and 1.573 eV corresponding to free electron-to- acceptor transition and a donor-acceptor pair (DAP) transition, respectively, along with a broad peak at 1.45 eV. This broad band emission is related to A-center chlorine based complex and also includes longitudinal (LO) phonon emission lines for CdTe spaced by ∼21 meV. Investigation into grain sizes revealed grains of 0.2 m for as-grown films and ∼2-3 m for chlorine activated films shown by atomic force microscopy (AFM). Raman analysis indicates that the films have been grown with excess of Te leading to p-type conductivity in the structure, whereas LO phonon mode of polycrystalline CdTe reveals quasi phonon modes nature.
ISSN:2053-1591
2053-1591
DOI:10.1088/2053-1591/2/2/025007