Loading…
Analysis on the structural, vibrational and defect states of chlorine treated polycrystalline cadmium telluride structures grown by e-beam evaporation
Temperature dependent photoluminescence (PL) measurements are performed in order to study the defect states in cadmium chloride treated polycrystalline cadmium telluride (CdTe) thin films grown by e-beam evaporation technique. Three luminescence bands are observed including a double peak emission at...
Saved in:
Published in: | Materials research express 2015-02, Vol.2 (2), p.25007-6 |
---|---|
Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Summary: | Temperature dependent photoluminescence (PL) measurements are performed in order to study the defect states in cadmium chloride treated polycrystalline cadmium telluride (CdTe) thin films grown by e-beam evaporation technique. Three luminescence bands are observed including a double peak emission at 1.577 eV and 1.573 eV corresponding to free electron-to- acceptor transition and a donor-acceptor pair (DAP) transition, respectively, along with a broad peak at 1.45 eV. This broad band emission is related to A-center chlorine based complex and also includes longitudinal (LO) phonon emission lines for CdTe spaced by ∼21 meV. Investigation into grain sizes revealed grains of 0.2 m for as-grown films and ∼2-3 m for chlorine activated films shown by atomic force microscopy (AFM). Raman analysis indicates that the films have been grown with excess of Te leading to p-type conductivity in the structure, whereas LO phonon mode of polycrystalline CdTe reveals quasi phonon modes nature. |
---|---|
ISSN: | 2053-1591 2053-1591 |
DOI: | 10.1088/2053-1591/2/2/025007 |