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Non-destructive analysis of Pb-acid battery positive plates, based on neutron tomography
Notwithstanding the in-depth understanding of lead-acid battery degradation processes developed in a time-honored field of science, there is still wide scope for knowledge-based technological advancements, in particular, targeting positive plate (PP) durability. Non-destructive imaging of the intern...
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Published in: | JPhys Energy 2024-01, Vol.6 (1), p.15006 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | Notwithstanding the in-depth understanding of lead-acid battery degradation processes developed in a time-honored field of science, there is still wide scope for knowledge-based technological advancements, in particular, targeting positive plate (PP) durability. Non-destructive imaging of the internal morphology, structure and chemistry of these components, enabled by neutron-based methods, is capable of disclosing otherwise inaccessible observables, that can form the factual basis for new pathways to device improvement. In this study, we propose a
post mortem
investigation of as-formed and electrochemically aged PPs, centered on neutron tomography and complemented by x-ray radiography and scanning-electron microscopy. These complementary imaging methods, thriving on different contrast mechanisms, allow 2D/3D position-sensitive morphological analyses of the nature and evolution of the positive active material (PAM) and of the spines of the PP, including: morphology variation, crack location, porosity distribution and identification of hydrogenated compounds. Specifically, in this work, we have pinpointed the differences in degradation modes—resulting from the application of a standard ageing protocol—of PPs fabricated in two technologically alternative ways: punching and gravity-casting, showing the superiority of the formed in terms of electrode stability upon charging abuse conditions. |
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ISSN: | 2515-7655 2515-7655 |
DOI: | 10.1088/2515-7655/ad0b89 |