Spatial and phase resolution in electron microscopy

Abstract With the invention of the aberration corrector in electron optics, the spatial resolution in electron microscopy has progressively improved and has now reached the sub-50-pm regime, and atomic-resolution electron microscopy has become a versatile tool for investigating the atomic structures...

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Published in:Microscopy 2023-04, Vol.72 (2), p.78-96
Main Authors: Ishikawa, Ryo, Morishita, Shigeyuki, Tanigaki, Toshiaki, Shibata, Naoya, Ikuhara, Yuichi
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Language:English
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cited_by cdi_FETCH-LOGICAL-c435t-e786e4bb8a5d6a9e456f11d467939626aa1bba003cbf8f78e682169a8667ae713
cites cdi_FETCH-LOGICAL-c435t-e786e4bb8a5d6a9e456f11d467939626aa1bba003cbf8f78e682169a8667ae713
container_end_page 96
container_issue 2
container_start_page 78
container_title Microscopy
container_volume 72
creator Ishikawa, Ryo
Morishita, Shigeyuki
Tanigaki, Toshiaki
Shibata, Naoya
Ikuhara, Yuichi
description Abstract With the invention of the aberration corrector in electron optics, the spatial resolution in electron microscopy has progressively improved and has now reached the sub-50-pm regime, and atomic-resolution electron microscopy has become a versatile tool for investigating the atomic structures in materials and devices. Furthermore, the phase resolution in electron microscopy also exhibits outstanding progress, and it has become possible to visualize electromagnetic fields at atomic dimensions, which strongly contributes to understanding the physical and chemical properties of materials. The electron microscopy society has grown with the improvements in spatial and phase resolutions, and hence, we must continuously develop new hardware, software and methodologies to boost these resolutions. Here, we review the historical progress of spatial and phase resolutions in electron microscopy, where we clarify the definition of these resolutions. We also discuss the future targets in electron microscopy.
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fullrecord <record><control><sourceid>oup_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1093_jmicro_dfac045</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><oup_id>10.1093/jmicro/dfac045</oup_id><sourcerecordid>10.1093/jmicro/dfac045</sourcerecordid><originalsourceid>FETCH-LOGICAL-c435t-e786e4bb8a5d6a9e456f11d467939626aa1bba003cbf8f78e682169a8667ae713</originalsourceid><addsrcrecordid>eNqFUD1PwzAQtRCIVqUrI8rKkPYc2xd7RBUUpEoMwBxdHFukSpooTob-e1LSsnLLveF96D3G7jmsOBix3tel7Zp14cmCVFdsnoCCWKXAry8YjZ6xZQh7GE8rDhJv2UwgGKlBzZn4aKkvqYroUETtNwUXdS401dCXzSEqD5GrnO27Ef9mBdu0xzt246kKbnn-C_b18vy5eY1379u3zdMutlKoPnapRifzXJMqkIyTCj3nhcTUCIMJEvE8JwBhc699qh3qhKMhjZiSS7lYsNXkewoOnfNZ25U1dceMQ3YaIJsGyM4DjIKHSdAOee2KP_ql7kh4nAjN0P5n9gM3EWas</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Spatial and phase resolution in electron microscopy</title><source>Oxford Journals Online</source><creator>Ishikawa, Ryo ; Morishita, Shigeyuki ; Tanigaki, Toshiaki ; Shibata, Naoya ; Ikuhara, Yuichi</creator><creatorcontrib>Ishikawa, Ryo ; Morishita, Shigeyuki ; Tanigaki, Toshiaki ; Shibata, Naoya ; Ikuhara, Yuichi</creatorcontrib><description>Abstract With the invention of the aberration corrector in electron optics, the spatial resolution in electron microscopy has progressively improved and has now reached the sub-50-pm regime, and atomic-resolution electron microscopy has become a versatile tool for investigating the atomic structures in materials and devices. Furthermore, the phase resolution in electron microscopy also exhibits outstanding progress, and it has become possible to visualize electromagnetic fields at atomic dimensions, which strongly contributes to understanding the physical and chemical properties of materials. The electron microscopy society has grown with the improvements in spatial and phase resolutions, and hence, we must continuously develop new hardware, software and methodologies to boost these resolutions. Here, we review the historical progress of spatial and phase resolutions in electron microscopy, where we clarify the definition of these resolutions. We also discuss the future targets in electron microscopy.</description><identifier>ISSN: 2050-5698</identifier><identifier>EISSN: 2050-5701</identifier><identifier>DOI: 10.1093/jmicro/dfac045</identifier><identifier>PMID: 36094805</identifier><language>eng</language><publisher>UK: Oxford University Press</publisher><ispartof>Microscopy, 2023-04, Vol.72 (2), p.78-96</ispartof><rights>The Author(s) 2022. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com 2022</rights><rights>The Author(s) 2022. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c435t-e786e4bb8a5d6a9e456f11d467939626aa1bba003cbf8f78e682169a8667ae713</citedby><cites>FETCH-LOGICAL-c435t-e786e4bb8a5d6a9e456f11d467939626aa1bba003cbf8f78e682169a8667ae713</cites><orcidid>0000-0001-9705-4942 ; 0000-0001-5801-0971 ; 0000-0003-3886-005X ; 0000-0003-3548-5952 ; 0000-0001-9703-9427</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/36094805$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Ishikawa, Ryo</creatorcontrib><creatorcontrib>Morishita, Shigeyuki</creatorcontrib><creatorcontrib>Tanigaki, Toshiaki</creatorcontrib><creatorcontrib>Shibata, Naoya</creatorcontrib><creatorcontrib>Ikuhara, Yuichi</creatorcontrib><title>Spatial and phase resolution in electron microscopy</title><title>Microscopy</title><addtitle>Microscopy (Oxf)</addtitle><description>Abstract With the invention of the aberration corrector in electron optics, the spatial resolution in electron microscopy has progressively improved and has now reached the sub-50-pm regime, and atomic-resolution electron microscopy has become a versatile tool for investigating the atomic structures in materials and devices. Furthermore, the phase resolution in electron microscopy also exhibits outstanding progress, and it has become possible to visualize electromagnetic fields at atomic dimensions, which strongly contributes to understanding the physical and chemical properties of materials. The electron microscopy society has grown with the improvements in spatial and phase resolutions, and hence, we must continuously develop new hardware, software and methodologies to boost these resolutions. Here, we review the historical progress of spatial and phase resolutions in electron microscopy, where we clarify the definition of these resolutions. We also discuss the future targets in electron microscopy.</description><issn>2050-5698</issn><issn>2050-5701</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2023</creationdate><recordtype>article</recordtype><recordid>eNqFUD1PwzAQtRCIVqUrI8rKkPYc2xd7RBUUpEoMwBxdHFukSpooTob-e1LSsnLLveF96D3G7jmsOBix3tel7Zp14cmCVFdsnoCCWKXAry8YjZ6xZQh7GE8rDhJv2UwgGKlBzZn4aKkvqYroUETtNwUXdS401dCXzSEqD5GrnO27Ef9mBdu0xzt246kKbnn-C_b18vy5eY1379u3zdMutlKoPnapRifzXJMqkIyTCj3nhcTUCIMJEvE8JwBhc699qh3qhKMhjZiSS7lYsNXkewoOnfNZ25U1dceMQ3YaIJsGyM4DjIKHSdAOee2KP_ql7kh4nAjN0P5n9gM3EWas</recordid><startdate>20230406</startdate><enddate>20230406</enddate><creator>Ishikawa, Ryo</creator><creator>Morishita, Shigeyuki</creator><creator>Tanigaki, Toshiaki</creator><creator>Shibata, Naoya</creator><creator>Ikuhara, Yuichi</creator><general>Oxford University Press</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0001-9705-4942</orcidid><orcidid>https://orcid.org/0000-0001-5801-0971</orcidid><orcidid>https://orcid.org/0000-0003-3886-005X</orcidid><orcidid>https://orcid.org/0000-0003-3548-5952</orcidid><orcidid>https://orcid.org/0000-0001-9703-9427</orcidid></search><sort><creationdate>20230406</creationdate><title>Spatial and phase resolution in electron microscopy</title><author>Ishikawa, Ryo ; Morishita, Shigeyuki ; Tanigaki, Toshiaki ; Shibata, Naoya ; Ikuhara, Yuichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c435t-e786e4bb8a5d6a9e456f11d467939626aa1bba003cbf8f78e682169a8667ae713</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2023</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ishikawa, Ryo</creatorcontrib><creatorcontrib>Morishita, Shigeyuki</creatorcontrib><creatorcontrib>Tanigaki, Toshiaki</creatorcontrib><creatorcontrib>Shibata, Naoya</creatorcontrib><creatorcontrib>Ikuhara, Yuichi</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><jtitle>Microscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ishikawa, Ryo</au><au>Morishita, Shigeyuki</au><au>Tanigaki, Toshiaki</au><au>Shibata, Naoya</au><au>Ikuhara, Yuichi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spatial and phase resolution in electron microscopy</atitle><jtitle>Microscopy</jtitle><addtitle>Microscopy (Oxf)</addtitle><date>2023-04-06</date><risdate>2023</risdate><volume>72</volume><issue>2</issue><spage>78</spage><epage>96</epage><pages>78-96</pages><issn>2050-5698</issn><eissn>2050-5701</eissn><abstract>Abstract With the invention of the aberration corrector in electron optics, the spatial resolution in electron microscopy has progressively improved and has now reached the sub-50-pm regime, and atomic-resolution electron microscopy has become a versatile tool for investigating the atomic structures in materials and devices. Furthermore, the phase resolution in electron microscopy also exhibits outstanding progress, and it has become possible to visualize electromagnetic fields at atomic dimensions, which strongly contributes to understanding the physical and chemical properties of materials. The electron microscopy society has grown with the improvements in spatial and phase resolutions, and hence, we must continuously develop new hardware, software and methodologies to boost these resolutions. Here, we review the historical progress of spatial and phase resolutions in electron microscopy, where we clarify the definition of these resolutions. We also discuss the future targets in electron microscopy.</abstract><cop>UK</cop><pub>Oxford University Press</pub><pmid>36094805</pmid><doi>10.1093/jmicro/dfac045</doi><tpages>19</tpages><orcidid>https://orcid.org/0000-0001-9705-4942</orcidid><orcidid>https://orcid.org/0000-0001-5801-0971</orcidid><orcidid>https://orcid.org/0000-0003-3886-005X</orcidid><orcidid>https://orcid.org/0000-0003-3548-5952</orcidid><orcidid>https://orcid.org/0000-0001-9703-9427</orcidid><oa>free_for_read</oa></addata></record>
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url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T14%3A55%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-oup_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Spatial%20and%20phase%20resolution%20in%20electron%20microscopy&rft.jtitle=Microscopy&rft.au=Ishikawa,%20Ryo&rft.date=2023-04-06&rft.volume=72&rft.issue=2&rft.spage=78&rft.epage=96&rft.pages=78-96&rft.issn=2050-5698&rft.eissn=2050-5701&rft_id=info:doi/10.1093/jmicro/dfac045&rft_dat=%3Coup_cross%3E10.1093/jmicro/dfac045%3C/oup_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c435t-e786e4bb8a5d6a9e456f11d467939626aa1bba003cbf8f78e682169a8667ae713%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/36094805&rft_oup_id=10.1093/jmicro/dfac045&rfr_iscdi=true