Machine-Learning-Assisted Statistical Analysis of Electron Microscopy Data for Nanoparticle Synthesis

Saved in:
Bibliographic Details
Published in:Microscopy and microanalysis 2024-07, Vol.30 (Supplement_1)
Main Authors: Cho, Min Gee, Oh, Myoung Hwan, Sytwu, Katherine, DaCosta, Luis Rangel, Groschner, Catherine, Scott, Mary C
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites cdi_FETCH-crossref_primary_10_1093_mam_ozae044_1763
container_end_page
container_issue Supplement_1
container_start_page
container_title Microscopy and microanalysis
container_volume 30
creator Cho, Min Gee
Oh, Myoung Hwan
Sytwu, Katherine
DaCosta, Luis Rangel
Groschner, Catherine
Scott, Mary C
description
doi_str_mv 10.1093/mam/ozae044.176
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1093_mam_ozae044_176</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1093_mam_ozae044_176</sourcerecordid><originalsourceid>FETCH-crossref_primary_10_1093_mam_ozae044_1763</originalsourceid><addsrcrecordid>eNqVj71uwjAUhS1EpULL3PW-gIndhARGxI86QBe6W1fuTTFy7Mj2Ep4eg3iBTufoSN-RPsY-pJhLsSqLDrvCX5FEVc1lU4_YRFblgi-lXIwfXfLVZ1O_smmMFyFEKZp6wuiI-mwc8QNhcMb98XWMJib6hVPClJvRaGHt0A55B9_CzpJOwTs4Gh181L4fYIsJofUBvtH5HkOmLMFpcOlMGXtnLy3aSLNnvrFiv_vZfPH7QQzUqj6YDsOgpFB3G5Vt1NNGZZvy_8QNlspXMg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Machine-Learning-Assisted Statistical Analysis of Electron Microscopy Data for Nanoparticle Synthesis</title><source>Oxford Journals Online</source><creator>Cho, Min Gee ; Oh, Myoung Hwan ; Sytwu, Katherine ; DaCosta, Luis Rangel ; Groschner, Catherine ; Scott, Mary C</creator><creatorcontrib>Cho, Min Gee ; Oh, Myoung Hwan ; Sytwu, Katherine ; DaCosta, Luis Rangel ; Groschner, Catherine ; Scott, Mary C</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1093/mam/ozae044.176</identifier><language>eng</language><ispartof>Microscopy and microanalysis, 2024-07, Vol.30 (Supplement_1)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-crossref_primary_10_1093_mam_ozae044_1763</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Cho, Min Gee</creatorcontrib><creatorcontrib>Oh, Myoung Hwan</creatorcontrib><creatorcontrib>Sytwu, Katherine</creatorcontrib><creatorcontrib>DaCosta, Luis Rangel</creatorcontrib><creatorcontrib>Groschner, Catherine</creatorcontrib><creatorcontrib>Scott, Mary C</creatorcontrib><title>Machine-Learning-Assisted Statistical Analysis of Electron Microscopy Data for Nanoparticle Synthesis</title><title>Microscopy and microanalysis</title><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNqVj71uwjAUhS1EpULL3PW-gIndhARGxI86QBe6W1fuTTFy7Mj2Ep4eg3iBTufoSN-RPsY-pJhLsSqLDrvCX5FEVc1lU4_YRFblgi-lXIwfXfLVZ1O_smmMFyFEKZp6wuiI-mwc8QNhcMb98XWMJib6hVPClJvRaGHt0A55B9_CzpJOwTs4Gh181L4fYIsJofUBvtH5HkOmLMFpcOlMGXtnLy3aSLNnvrFiv_vZfPH7QQzUqj6YDsOgpFB3G5Vt1NNGZZvy_8QNlspXMg</recordid><startdate>20240724</startdate><enddate>20240724</enddate><creator>Cho, Min Gee</creator><creator>Oh, Myoung Hwan</creator><creator>Sytwu, Katherine</creator><creator>DaCosta, Luis Rangel</creator><creator>Groschner, Catherine</creator><creator>Scott, Mary C</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20240724</creationdate><title>Machine-Learning-Assisted Statistical Analysis of Electron Microscopy Data for Nanoparticle Synthesis</title><author>Cho, Min Gee ; Oh, Myoung Hwan ; Sytwu, Katherine ; DaCosta, Luis Rangel ; Groschner, Catherine ; Scott, Mary C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-crossref_primary_10_1093_mam_ozae044_1763</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cho, Min Gee</creatorcontrib><creatorcontrib>Oh, Myoung Hwan</creatorcontrib><creatorcontrib>Sytwu, Katherine</creatorcontrib><creatorcontrib>DaCosta, Luis Rangel</creatorcontrib><creatorcontrib>Groschner, Catherine</creatorcontrib><creatorcontrib>Scott, Mary C</creatorcontrib><collection>CrossRef</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cho, Min Gee</au><au>Oh, Myoung Hwan</au><au>Sytwu, Katherine</au><au>DaCosta, Luis Rangel</au><au>Groschner, Catherine</au><au>Scott, Mary C</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Machine-Learning-Assisted Statistical Analysis of Electron Microscopy Data for Nanoparticle Synthesis</atitle><jtitle>Microscopy and microanalysis</jtitle><date>2024-07-24</date><risdate>2024</risdate><volume>30</volume><issue>Supplement_1</issue><issn>1431-9276</issn><eissn>1435-8115</eissn><doi>10.1093/mam/ozae044.176</doi></addata></record>
fulltext fulltext
identifier ISSN: 1431-9276
ispartof Microscopy and microanalysis, 2024-07, Vol.30 (Supplement_1)
issn 1431-9276
1435-8115
language eng
recordid cdi_crossref_primary_10_1093_mam_ozae044_176
source Oxford Journals Online
title Machine-Learning-Assisted Statistical Analysis of Electron Microscopy Data for Nanoparticle Synthesis
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T01%3A48%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Machine-Learning-Assisted%20Statistical%20Analysis%20of%20Electron%20Microscopy%20Data%20for%20Nanoparticle%20Synthesis&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Cho,%20Min%20Gee&rft.date=2024-07-24&rft.volume=30&rft.issue=Supplement_1&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1093/mam/ozae044.176&rft_dat=%3Ccrossref%3E10_1093_mam_ozae044_176%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-crossref_primary_10_1093_mam_ozae044_1763%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true